Resumen
ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis.
ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL.
Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.
Informaciones generales
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Estado: RetiradaFecha de publicación: 2011-11Etapa: Retirada de la Norma Internacional [95.99]
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Edición: 1Número de páginas: 17
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Comité Técnico :ISO/TC 229ICS :07.120
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Ciclo de vida
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Ahora
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Revisada por
PublicadoISO/TS 11888:2017