ISO 24173:2009
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ISO 24173:2009
42052

Estado : Retirada

Esta norma ha sido revisada por ISO 24173:2024

Resumen

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

Informaciones generales

  •  : Retirada
     : 2009-09
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 43
  • ISO/TC 202
    71.040.50 
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