ISO 15632:2012
Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Reference number
ISO 15632:2012
Edición 2
2012-08
Retirada
ISO 15632:2012
52661
Retirada (Edición 2, 2012)

Resumen

This International Standard defines the most important quantities that characterize an energy-dispersive X-ray spectrometer consisting of a semiconductor detector, a pre-amplifier and a signal-processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid-state ionization. This International Standard specifies minimum requirements and how relevant instrumental performance parameters are to be checked for such spectrometers attached to a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA). The procedure used for the actual analysis is outlined in ISO 22309[2] and ASTM E1508[3] and is outside the scope of this International Standard.

Informaciones generales

  •  : Retirada
     : 2012-08
    : Retirada de la Norma Internacional [95.99]
  •  : 2
     : 11
  • ISO/TC 202
    71.040.99 
  • RSS actualizaciones

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