Résumé
This document specifies a test method for plasma resistance of ceramic components in semiconductor manufacturing equipment. It is applicable to ceramic components of plasma-resistant components in dry etching chambers used in semiconductor manufacturing.
Informations générales
-
État actuel: PubliéeDate de publication: 2019-06Stade: Norme internationale confirmée [90.93]
-
Edition: 1
-
Comité technique :ISO/TC 206ICS :81.060.30
- RSS mises à jour