Reference number
ISO 18452:2005
© ISO 2024
International Standard
ISO 18452:2005
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
Edition 1
2005-11
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Published (Edition 1, 2005)
This publication was last reviewed and confirmed in 2019. Therefore this version remains current.

ISO 18452:2005

Language
Format
CHF 63
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Abstract

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

General information

  • Status
     : Published
    Publication date
     : 2005-11
    Stage
    : International Standard under systematic review [90.20]
  • Edition
     : 1
    Number of pages
     : 9
  • Technical Committee :
    ISO/TC 206
    ICS :
    81.060.30 
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Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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